JZ
Jiaguo Zhang
physics.ins-dethybrid detectorshybrid pixel detectorssilicon detectorssingle photon countingX-ray detectorX-ray detectorsAGIPDbismuth ferritechromium compensated
On Valency
published · living versionsW_dc7rx7vg·v1 · currentpublished
Soft X-Ray Detection Down to the Nitrogen K-Edge Using a Pixelated iLGAD Sensor
with Shuqi Li, Anna Bergamaschi, Ashish Bisht, Maurizio Boscardin +33
1 version
Preprints & journals
35 papers in the corpus · 2008–2026Enhanced micrometre spatial resolution and usable photon flux for hybrid pixel detectors via deep-learning-based X-ray localization2610.11044v1 · Xiangyu Xie, Anna Bergamaschi, Martin Bruckner et al.2026 · 0 citationsarXiv
Non-destructive 3D doping imaging of silicon sensors2609.08769v1 · Xiangyu Xie, Anna Bergamaschi, Maria Carulla et al.2026 · 0 citationsarXiv
Investigating the Impact of Sensor Layout on Radiation Hardness in 25 µm Pitch Hybrid Pixel Detectors for 4th Generation Synchrotron Light Sources.40968883 · Heymes, Julian, Baruffaldi, Filippo, Bergamaschi, Anna et al.2025 · 0 citationsSensors (Basel, Switzerland). 2025;25(11)
MYTHEN III: advancements in single photon counting detectors for synchrotron powder diffraction experiments.39946283 · Andrä, Marie, Bergamaschi, Anna, Baruffaldi, Filippo et al.2025 · 5 citationsJournal of synchrotron radiation. 2025;32(Pt 2):365-377
Optimizing Charge Transport Simulation for Hybrid Pixel Detectors2407.20841v3 · X. Xie, R. Barten, A. Bergamaschi et al.2024 · 3 citationsarXiv
Ptychographic Nanoscale Imaging of the Magnetoelectric Coupling in Freestanding BiFeO3.38402421 · Butcher, Tim A, Phillips, Nicholas W, Chiu, Chun-Chien et al.2024 · 28 citationsAdvanced materials (Deerfield Beach, Fla.). 2024;36(23):e2311157
Quantum Efficiency Measurement and Modeling of Silicon Sensors Optimized for Soft X-ray Detection.38339659 · Carulla, Maria, Barten, Rebecca, Baruffaldi, Filippo et al.2024 · 6 citationsSensors (Basel, Switzerland). 2024;24(3)
Characterization of iLGADs using soft X-rays2310.14706v1 · Antonio Liguori, Rebecca Barten, Filippo Baruffaldi et al.2023 · 6 citationsJournal of Instrumentation 18, P12006 (2023)
Detection of MeV electrons using a charge integrating hybrid pixel detector2210.16199v1 · E. Frojdh, F. Baruffaldi, A. Bergamaschi et al.2022 · 2 citationsarXiv
Development of LGAD sensors with a thin entrance window for soft X-ray detection2210.12993v1 · Jiaguo Zhang, Rebecca Barten, Filippo Baruffaldi et al.2022 · 22 citationsarXiv
Design and first tests of the Gotthard-II readout ASIC for the European X-ray Free-Electron Laser2103.15405v1 · Jiaguo Zhang, Marie Andrae, Rebecca Barten et al.2021 · 14 citationsarXiv
Characterization of Chromium Compensated GaAs Sensors with the Charge-Integrating JUNGFRAU Readout Chip by Means of a Highly Collimated Pencil Beam.33672262 · Greiffenberg, Dominic, Andrä, Marie, Barten, Rebecca et al.2024 · 31 citationsSensors (Basel, Switzerland). 2021;21(4)
Megapixels @ Megahertz -- The AGIPD High-Speed Cameras for the European XFEL1908.02103v1 · Ulrich Trunk, Aschkan Allahgholi, Julian Becker et al.2019 · 57 citationsarXiv
Development of low-energy X-ray detectors using LGAD sensors.31274448 · Andrä, Marie, Zhang, Jiaguo, Bergamaschi, Anna et al.2019 · 35 citationsJournal of synchrotron radiation. 2019;26(Pt 4):1226-1237
The Adaptive Gain Integrating Pixel Detector at the European XFEL.30655470 · Allahgholi, Aschkan, Becker, Julian, Delfs, Annette et al.2019 · 127 citationsJournal of synchrotron radiation. 2019;26(Pt 1):74-82
Megahertz serial crystallography.30279492 · Wiedorn, Max O, Oberthür, Dominik, Bean, Richard et al.2018 · 202 citationsNature communications. 2018;9(1):4025
Towards Gotthard-II: Development of A Silicon Microstrip Detector for the European X-ray Free-Electron Laser1711.07555v1 · Jiaguo Zhang, Marie Andra, Rebecca Barten et al.2017 · 15 citationsarXiv
The EIGER detector for low-energy electron microscopy and photoemission electron microscopy.28862618 · Tinti, G, Marchetto, H, Vaz, C A F et al.2019 · 21 citationsJournal of synchrotron radiation. 2017;24(Pt 5):963-974
Micrometer-resolution imaging using MÖNCH: towards G2-less grating interferometry.27787252 · Cartier, Sebastian, Kagias, Matias, Bergamaschi, Anna et al.2018 · 64 citationsJournal of synchrotron radiation. 2016;23(Pt 6):1462-1473
Detector developments at DESY.26698052 · Wunderer, Cornelia B, Allahgholi, Aschkan, Bayer, Matthias et al.2016 · 7 citationsJournal of synchrotron radiation. 2016;23(1):111-7
Design and First Tests of a Radiation-Hard Pixel Sensor for the European X-Ray Free-Electron Laser1402.3129v1 · Joern Schwandt, Eckhart Fretwurst, Robert Klanner et al.2014 · 12 citationsarXiv
Study of X-ray radiation damage in the AGIPD sensor for the European XFEL1312.3928v1 · Jiaguo Zhang, Eckhart Fretwurst, Heinz Graafsma et al.2013 · 12 citationsarXiv
Time dependence of charge losses at the Si-SiO2 interface in p+n-silicon strip sensors1305.0398v1 · Thomas Poehlsen, Eckhart Fretwurst, Robert Klanner et al.2013 · 10 citationsT. Poehlsen, et al., Nuclear Instruments and Methods In Physics Research A (2013)
Challenges for the Adaptive Gain Integrating Pixel Detector (AGIPD) design due to the high intensity photon radiation environment at the European XFEL1303.2523v1 · J. Becker, L. Bianco, P. Gottlicher et al.2013 · 8 citationsarXiv
Study of the accumulation layer and charge losses at the Si-SiO2 interface in p+n-silicon strip sensors1302.6077v1 · Thomas Poehlsen, Julian Becker, Eckhart Fretwurst et al.2013 · 11 citationsarXiv
Challenges for Silicon Pixel Sensors at the European XFEL1212.5045v1 · Robert Klanner, Julian Becker, Eckhart Fretwurst et al.2012 · 22 citationsarXiv
Design of the AGIPD Sensor for the European XFEL1210.0430v2 · J. Schwandt, E. Fretwurst, R. Klanner et al.2012 · 23 citationsarXiv
Charge losses in segmented silicon sensors at the Si-SiO2 interface1207.6538v2 · Thomas Poehlsen, Eckhart Fretwurst, Robert Klanner et al.2012 · 38 citationsNuclear Instruments and Methods in Physics Research A 700 (2013) 22-39
Study of radiation damage induced by 12 keV X-rays in MOS structures built on high-resistivity n-type silicon.22514167 · Zhang, Jiaguo, Pintilie, Ioana, Fretwurst, Eckhart et al.2012 · 53 citationsJournal of synchrotron radiation. 2012;19(Pt 3):340-6
Optimization of the Radiation Hardness of Silicon Pixel Sensors for High X-ray Doses using TCAD Simulations1111.4901v1 · J. Schwandt, E. Fretwurst, R. Klanner et al.2011 · 32 citationsarXiv
Study of X-ray Radiation Damage in Silicon Sensors1111.1180v1 · Jiaguo Zhang, Eckhart Fretwurst, Robert Klanner et al.2011 · 30 citationsarXiv
Study of radiation damage induced by 12 keV X-rays in MOS structures built on high resistivity n-type silicon1107.5949v2 · Jiaguo Zhang, Ioana Pintilie, Eckhart Fretwurst et al.2011 · 6 citationsarXiv
Cross section measurement for the (95)Mo(n, alpha)(92)Zr reaction at 4.0, 5.0 and 6.0MeV.19811925 · Zhang, Guohui, Wu, Hao, Zhang, Jiaguo et al.2010 · 6 citationsApplied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine. 2010;68(1):180-3
Measurement of cross sections for the 147Sm(n, alpha)144Nd reaction at 5.0 and 6.0 MeV.18707895 · Zhang, Guohui, Zhang, Jiaguo, Guo, Li'an et al.2009 · 7 citationsApplied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine. 2009;67(1):46-9
Cross-section measurement for the 10B(n, alpha)7Li reaction at 4.0 and 5.0 MeV.18387305 · Zhang, Guohui, Guo, Li'an, Cao, Rongtai et al.2008 · 18 citationsApplied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine. 2008;66(10):1427-30
Career total: 102 works. 35 are in this corpus.
Profile built from the corpus for this byline.
Author records are still filling in while the Hub is in alpha. If this is your page, you'll be able to claim it soon. Spot a mistake? Tell us.